joel jsm it800 sem eds  (JEOL)

Journal: Nature Communications

Article Title: Confined shear-induced structure discretization enables re-entrant super-repellent metals

doi: 10.1038/s41467-026-77150-7

Figure Lengend Snippet: a , b Schematics comparing between cave-trapezoid cutting tool (CTCT, a ) and the trapezoid cutting tool (TCT, b ). The confined shear–induced structure discretization (CSSD) mechanism enables CTCT to generate discrete re-entrant structures. In comparison, TCT produces a continuous, ridged structure during cutting. c Scanning electron microscope (SEM) image of microtextured cutting tool integrated with cave-trapezoid/trapezoid textures, and their corresponding discrete/continuous surface structures machined on copper, respectively. The inset in the right SEM image illustrates the re-entrant cross-section of the discrete structure. The cutting tools are all made of polycrystalline diamond. Scale bar: 100 μm. d Comparison of material removal rate (MRR) and processing structure area presented for mechanical cutting (this work) in contrast to other surface fabrication routes, including reactive-ion etching/deep reactive-ion etching (RIE/DRIE), laser direct writing, electrochemical etching, and chemical etching. The detailed sources are listed in the Supplementary Fig. . e Dyed water droplets on CTCT-machined copper sheets and rods, demonstrating the liquid-repellency of re-entrant structures applicable to both planar and curved surfaces. Scale bar: 5 mm. f Schematic of re-entrant discretization process. CTCT cutting-induced confined plastic flow and geometry transfer lead to grain refinement and passivation layer formation. g Nanoindentation measurement results. It shows that the CSSD boosts the hardness and elastic modulus of the structural area after processing.

Article Snippet: Discrete structures and tool microstructures were imaged by SEM (SEM, SU3900, Hitachi High-Tech Corporation, Japan) and TEM (TEM, JEM-F200, JEOL, Japan).

Techniques: Shear, Comparison, Microscopy

Journal: Nature Communications

Article Title: Confined shear-induced structure discretization enables re-entrant super-repellent metals

doi: 10.1038/s41467-026-77150-7

Figure Lengend Snippet: a The schematic configuration of the cave-trapezoid cutting tool (CTCT). b 2D reduced-order cutting model. The structure discretization comprises three stages: confinement-driven material accumulation ( F f > F r ) (i), shea r -triggered structural discretization ( F f = F r ) (ii), and separation of the resulting units ( F f = F r ) (iii). c Balance-model calculation curve identifying the discrete point. Copper (Cu) was used as the case material for this calculation. ε ’ is the equivalent plastic strain along the cutting direction. For the cutting process of Cu, ε ’ is 32.446 at the discrete point ( F f = F r ). The inset diagram shows ε ’ at discrete points for different groove geometries. S represents the cross-sectional area of the trapezoidal groove in the CTCT. d 3D FEA simulation cutting model illustrating the structure-discretization process, which comprises three stages: accumulation (i), shear (ii), and separation (iii). e The value of effective plastic strain ε ’ at discrete points for various metallic materials. f Comparison of the L y values obtained from the modified 3D simulation and cutting experiments for various metallic materials. The errors represent the standard deviations from at least three independent experiments. g Scanning electron microscope (SEM) images of the top-down view (top) and cross-sectional views (bottom) of a single discrete structure on Cu substrate. The C1 cross-section shows an inverted-trapezoidal profile matching the programmed re-entrant geometry. The C2 cross-section reveals compressed flow within the structure. Scale bar: 10 μm. h , i Transmission electron microscopy (TEM) images of the cross-sectional view of the discrete structure, which show the extrusion-induced grain refinement ( h , image of the C1 cross-section) and grain elongation ( i , image of the C2 cross-section). The scale bars in ( h ) and ( i ) are 2 μm and 500 nm, respectively. The cross-sectional samples for SEM and TEM characterization were prepared using a focused ion beam (FIB). A platinum (Pt) protective layer was deposited on the sample surface to prevent damage during milling. The figure ( h ) is a false-colored image, in which the colors were assigned arbitrarily to distinguish individual grains and have no additional physical significance. j 2D finite element analysis (FEA) model of material flow during CTCT cutting. k Flow velocity depends on rake angle β of cutting tools at the selected position in ( j ). Cu was used as the case material for FEA analysis.

Article Snippet: Discrete structures and tool microstructures were imaged by SEM (SEM, SU3900, Hitachi High-Tech Corporation, Japan) and TEM (TEM, JEM-F200, JEOL, Japan).

Techniques: Shear, Comparison, Modification, Microscopy, Transmission Assay, Electron Microscopy, Platinum, Analysis

Journal: Nature Communications

Article Title: Confined shear-induced structure discretization enables re-entrant super-repellent metals

doi: 10.1038/s41467-026-77150-7

Figure Lengend Snippet: a The schematic configuration of the cave-trapezoid cutting tool (CTCT) geometric parameters. b The schematic configuration of the front view (top) and top-down views (bottom) of the geometric parameters of discrete structures on a Cu substrate. c , d Scanning electron microscope (SEM) images of the top-down view of the discrete structure with increasing H c ( c ) and S t ( d ). Scale bar: 25 μm. e The values of w as, and h s are insensitive to H c , but L s shows a strong dependence on H c . The errors represent the standard deviations from at least three independent experiments. f The values of w as , h s, and L s are affected by S t . The errors represent the standard deviations from at least three independent experiments. g – i The values of h s ( g ), w as ( h ), and L s ( i ) of discrete structures vary weakly with different cutting parameters.

Article Snippet: Discrete structures and tool microstructures were imaged by SEM (SEM, SU3900, Hitachi High-Tech Corporation, Japan) and TEM (TEM, JEM-F200, JEOL, Japan).

Techniques: Microscopy

Journal: Nature Communications

Article Title: Confined shear-induced structure discretization enables re-entrant super-repellent metals

doi: 10.1038/s41467-026-77150-7

Figure Lengend Snippet: a The evolution of the CA of different surfaces under sandpaper abrasion. The inset image in ( a ) shows the abrasion test equipment. The errors represent the standard deviations from at least three independent experiments. b The schematic configuration of the wear mechanism of discrete structures. Scanning electron microscope (SEM) images of the top-down view of before (top) and after (down) 1000-cycle abrasion. Scale bar: 50 μm. c The value of CA after sand-impact testing as a function of sand volume. The inset image in ( c ) shows the schematic diagram of the falling sand impact test. * p < 0.05, ** p < 0.01, and *** p < 0.001. d The value of CA after water-flow impact testing as a function of water-flow impacting time. The inset image in ( d ) shows the schematic diagram of the water-flow impact test. * p < 0.05, ** p < 0.01, and *** p < 0.001. e The value of CA after tape-peeling testing as a function of tap e -peeling times. The inset image in ( e ) shows the schematic diagram of the tape-peeling test. * p < 0.05, ** p < 0.01, and *** p < 0.001. f The contact angle (CA) and the contact angle hysteresis (CAH) results of RES after the pressure stability test. The inset image in ( f ) shows the schematic diagram of the pressure stability test. Scale bar: 10 mm. g The comparison of ice shear strength, τ ice , between RES and pristine Cu. The inset image in ( g ) shows the schematic diagram of the device for the ice adhesion test. The errors represent the standard deviations from at least three independent experiments. ( h ) The key features of the supercooled-droplet impact process at an impact velocity of 1 m s −1 on RESs at two different temperatures (Specimen temperature = −10 °C and −20 °C). Scale bar: 5 mm. The errors in ( c – f ) represent standard deviations from at least seven independent experiments.

Article Snippet: Discrete structures and tool microstructures were imaged by SEM (SEM, SU3900, Hitachi High-Tech Corporation, Japan) and TEM (TEM, JEM-F200, JEOL, Japan).

Techniques: Microscopy, Stability, Comparison, Shear