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$Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.$
X Ray Diffraction Xrd Analysis, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 44094 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x+ray+diffraction/SmartLab/pmc13650019-228-10-20
Average 99 stars, based on 44094 article reviews

x ray diffraction xrd analysis - by Bioz Stars, 2026-10

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1) Product Images from "Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing"

Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing

Journal: Advanced Science

doi: 10.1002/advs.78072

$Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. (b) X‐ray diffraction patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.$
Figure Legend Snippet: Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. (b) X‐ray diffraction patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.

Techniques Used: Sublimation

X-ray Diffraction:

Article Title: Targeting the circadian negative regulator period in Bombyx mori : a strategy for improving silk fibroin yield and mechanical properties
Article Snippet: Deconvolution and curve fitting of the amide I band (1600–1700 cm −1 ) were performed using PeakFit software (version 4.12; Systat Software GmbH, Erkrath, Germany). .. XRD patterns were recorded with a SmartLab X-ray diffractometer (Rigaku Corporation, Tokyo, Japan) with Cu Kα radiation, over a 2θ range of 5° to 80° at a scanning rate of 10°/min. ..

Article Title: A Scalable Spin‐Coating Strategy for Mesoporous Gold Thin Films toward miRNA Detection
Article Snippet: Detailed cross‐sectional S/TEM images were obtained using a Hitachi HF5000 operated in TEM and STEM configuration on a lamella sample mounted on a Si grid. .. Crystallographic information for the spin‐coated thin films was recorded using a Rigaku SmartLab XRD instrument with Cu Kα radiation. .. All electrochemical characterizations were performed using CH Instruments in a 3‐electrode configuration with Ag/AgCl (in 3 M saturated KCl solution) reference and Pt wire as the counter electrode.

Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing
Article Snippet: .. To examine changes in the interlayer spacing and crystallographic structure, x‐ray diffraction (XRD) analysis was conducted using a SmartLab diffractometer (Rigaku) with Cu Kα radiation (λ = 0.15412 nm). .. The interlayer spacing was calculated using Bragg's law ( n λ = 2d sin(θ) ), where d is the spacing between adjacent layers, λ is the x‐ray wavelength, and θ is the diffraction angle.

Article Title: Electrochemical Investigation of Compatibility Between Chloride‐ and Sulfide‐Based Solid Electrolytes Using Four‐Electrode Cells
Article Snippet: .. XRD measurements were performed using an X‐ray diffractometer (SmartLab, Rigaku) with Cu Kα1 radiation. ..

Article Title: Overcoming Out-of-Plane Conduction by Changing Nanosheet Morphology.
Article Snippet: HAADF-STEM images and TEM–EDS data ere obtained using a JEM-ARM200F NEOARM (JEOL). .. XRD ata of Li MM ′ O6 powders, H MM ′ O6 powders, TBA/ MM ′ O6 and MM ′ O6 membranes were examined by a SmartLab diffractomeer (Rigaku) with Cu K α radiation. .. XPS spectra of H MM ′ O6 embranes were measured with an x-ray photoelectron specrometer PHI GENESIS (ULVAC-PHI, INCORPORATED).

Thin Films:

Analysis:

other:

Article Title: Multi-biomimetic poly(amino acid)-based Janus membrane integrating barrier and osteoinductive functions for cranial bone regeneration
Article Snippet: Crystalline structures of the samples were characterized by X-ray diffraction (XRD, SmartLab, Rigaku Corporation, Japan) using Cu Kα radiation (λ = 1.5406 Å).

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Journal: Advanced Science

Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing

doi: 10.1002/advs.78072

Figure Lengend Snippet: Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. (b) X‐ray diffraction patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.

Article Snippet: To examine changes in the interlayer spacing and crystallographic structure, x‐ray diffraction (XRD) analysis was conducted using a SmartLab diffractometer (Rigaku) with Cu Kα radiation (λ = 0.15412 nm).

Techniques: Sublimation

$Physicochemical and mechanical characterization of the hydrogel formulations. A) Schematic illustration of the preparation of GA–Zn 2+ /BP@SilMA and incorporation of osteogenic bone microtissues (BO). B) Photographs of the hydrogel precursor before and after ultraviolet. C) Scanning electron microscopy (SEM) images of SilMA, GA–Zn 2+ @SilMA, GA–Zn 2+ /BP@SilMA, and GA–Zn 2+ /BP/BO@SilMA hydrogels. D) Energy-dispersive X-ray spectroscopy (EDS) elemental maps of C, O, P, and Zn in the composite hydrogel. E) Fourier-transform infrared spectroscopy (FTIR) spectra of the different hydrogel formulations. F) X-ray diffraction (XRD) patterns of the different hydrogel formulations. G) Atomic force microscopy (AFM) force–separation curves. H) Zn 2+ release profile. I) Degradation behavior of the hydrogel. J) Young's modulus of the different hydrogel formulations. Data are presented as mean ± SD. *p < 0.05 and ****p < 0.0001.$

Journal: Materials Today Bio

Article Title: Hydrogel-integrated osteogenic microtissues promote repair of infected intervertebral defects through sequential immunomodulation

doi: 10.1016/j.mtbio.2026.103657

Figure Lengend Snippet: Physicochemical and mechanical characterization of the hydrogel formulations. A) Schematic illustration of the preparation of GA–Zn 2+ /BP@SilMA and incorporation of osteogenic bone microtissues (BO). B) Photographs of the hydrogel precursor before and after ultraviolet. C) Scanning electron microscopy (SEM) images of SilMA, GA–Zn 2+ @SilMA, GA–Zn 2+ /BP@SilMA, and GA–Zn 2+ /BP/BO@SilMA hydrogels. D) Energy-dispersive X-ray spectroscopy (EDS) elemental maps of C, O, P, and Zn in the composite hydrogel. E) Fourier-transform infrared spectroscopy (FTIR) spectra of the different hydrogel formulations. F) X-ray diffraction (XRD) patterns of the different hydrogel formulations. G) Atomic force microscopy (AFM) force–separation curves. H) Zn 2+ release profile. I) Degradation behavior of the hydrogel. J) Young's modulus of the different hydrogel formulations. Data are presented as mean ± SD. *p < 0.05 and ****p < 0.0001.

Article Snippet: Energy-dispersive X-ray spectroscopy (EDS, Sigma 360, ZEISS, Germany) mapping was used to examine the distribution of C, O, Zn, and P.Fourier transform infrared spectroscopy(FTIR, Nicolet iS50, Thermo Fisher Scientific, USA) was performed with 32 scans in the range of 4000–400 cm −1 at a resolution of 4 cm −1 ; X-ray diffraction patterns (XRD, SmartLab SE, Rigaku Corporation, Japan) were recorded from 5° to 90°.

Techniques: Scanning Electron Microscopy, Energy Dispersive X-Ray, Spectroscopy, Fourier Transform Infrared Spectroscopy, Microscopy