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proprietary transfer-matrix method (tmm) matlab code  (MathWorks Inc)


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    MathWorks Inc proprietary transfer-matrix method (tmm) matlab code
    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
    Proprietary Transfer Matrix Method (Tmm) Matlab Code, supplied by MathWorks Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/transfer-matrix+code/pmc09523610-36-26-29
    Average 90 stars, based on 1 article reviews
    proprietary transfer-matrix method (tmm) matlab code - by Bioz Stars, 2026-09
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    1) Product Images from "Low-Temperature Stability and Sensing Performance of Mid-Infrared Bloch Surface Waves on a One-Dimensional Photonic Crystal"

    Article Title: Low-Temperature Stability and Sensing Performance of Mid-Infrared Bloch Surface Waves on a One-Dimensional Photonic Crystal

    Journal: ACS Applied Materials & Interfaces

    doi: 10.1021/acsami.2c07894

    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method (TMM) calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
    Figure Legend Snippet: (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method (TMM) calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.

    Techniques Used: Electron Microscopy, Refractive Index

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    Article Snippet: Interestingly, although we employed the default cost error matrix ( i.e., \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{upgreek} \usepackage{mathrsfs} \setlength{\oddsidemargin}{-69pt} \begin{document} $ \left[ 01;10 \right] $\end{document} 01 ; 10 in order following MATLAB matrix notation) in the balanced data analysis above, we compensated the other classifiers (except RUSBoost) with a customized cost matrix for the imbalanced analysis, penalizing the error committed for classifying a sample in the majority class when the actual class is the critical one: \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{upgreek} \usepackage{mathrsfs} \setlength{\oddsidemargin}{-69pt} \begin{document} $ \left[ 01;\delta 0 \right] $\end{document} 01 ; δ 0 where δ is the ratio between the cardinalities of the majority and minority groups.

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    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method <t>(TMM)</t> calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.
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    (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method (TMM) calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.

    Journal: ACS Applied Materials & Interfaces

    Article Title: Low-Temperature Stability and Sensing Performance of Mid-Infrared Bloch Surface Waves on a One-Dimensional Photonic Crystal

    doi: 10.1021/acsami.2c07894

    Figure Lengend Snippet: (a) Sketch of the Kretschmann–Raether configuration. The prism is quoted and the radiation wavevector k has been decomposed in its parallel, β , and perpendicular, k x , components. (b) Scanning electron microscopy (SEM) image of the focused ion beam (FIB) milled cross-section of the deposited 1D-PC and a sketch of the transverse geometry with measured layer thicknesses. (c) R (θ,λ) reflectance map according to the transfer-matrix method (TMM) calculation for σ polarization. The black and red lines are the photonic band edges (BEs), calculated for the infinitely extended 1D-PC. The surface waves (SWs) and the band-edge (BE) modes appear as dark reflectance lines. In the insets, we plot the square modulus of the electric fields of the modes, superimposed on the 1D-PC refractive index distribution. The external medium is vacuum.

    Article Snippet: Based on the real 1D-PC geometry and materials’ optical properties, the room temperature numerical simulation of the reflectance R (θ,λ) was carried out by a proprietary transfer-matrix method (TMM) MATLAB code.

    Techniques: Electron Microscopy, Refractive Index