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microchannel plate detector rectangular  (Hamamatsu)

 
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    Structured Review

    Hamamatsu microchannel plate detector rectangular
    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
    Microchannel Plate Detector Rectangular, supplied by Hamamatsu, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/rectangular+microchannel/microchannel+plate+detector+rectangular/pmc10313518-95-17-21
    Average 90 stars, based on 1 article reviews
    microchannel plate detector rectangular - by Bioz Stars, 2026-10
    90/100 stars

    Images

    1) Product Images from "Probing lithium mobility at a solid electrolyte surface"

    Article Title: Probing lithium mobility at a solid electrolyte surface

    Journal: Nature Materials

    doi: 10.1038/s41563-023-01535-y

    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.
    Figure Legend Snippet: a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Techniques Used: Battery

    Related Articles

    Battery:

    Article Title: Probing lithium mobility at a solid electrolyte surface
    Article Snippet: The beam was dispersed using a diffraction grating with 1,200 grooves mm –1 before collection on a microchannel plate detector (Rectangular, Hamamatsu Photonics) coated with CsI.

    Article Title: Sensitive Mass Spectrometer for Time-Resolved Gas-Phase Chemistry Studies at High Pressures.
    Article Snippet: The ions proceed through a 22.6 in. long field-free region, reflect at a 6° angle from a two-stage ion mirror, and are focused onto an 80 × 30 mm2 rectangular microchannel plate (MCP) detector (Hamamatsu.)



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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    Image Search Results


    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Journal: Nature Materials

    Article Title: Probing lithium mobility at a solid electrolyte surface

    doi: 10.1038/s41563-023-01535-y

    Figure Lengend Snippet: a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Article Snippet: The beam was dispersed using a diffraction grating with 1,200 grooves mm –1 before collection on a microchannel plate detector (Rectangular, Hamamatsu Photonics) coated with CsI.

    Techniques: Battery