4d stem diffraction maps (Gatan Inc)

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Gatan Inc 4d stem diffraction maps
4d Stem Diffraction Maps, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 589 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/4d+stem+diffraction+maps/STEMx+System/pm32187582-105-1-9
Average 96 stars, based on 589 article reviews

4d stem diffraction maps - by Bioz Stars, 2026-09

96/100 stars

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Article Title: Anisotropic redistribution of coherently de-channelled electrons around dislocations in gallium nitride revealed by 4D Scanning Transmission Electron Microscopy.
Article Snippet: In this study, we employ 4D Scanning Transmission Electron Microscopy (4D-STEM) to investigate the relationship between image contrast, convergent beam electron diffraction (CBED) patterns, and local lattice distortions near dislocations in 2H-GaN.. Our findings reveal a pronounced anisotropic spreading of the CBED pattern, which correlates with the local distortion of atomic channels and, therefore, with the direction of the Burgers vector of the dislocation.. This behavior is a consequence of electron beam channelling perturbation caused by low-curvature channels.

Transmission Electron Microscopy:

Article Title: AlCoCrFeNi2.1 Eutectic High Entropy Alloy: Defect Analysis, Microstructural Stability and Ion Irradiation Resilience
Article Snippet: TEM characterization was performed using JEOL JEM-2100F and JEOL JEM-2100, both operating at 200 kV, and equipped with Energy Dispersive Spectroscopy (EDS) analyzers. .. Scanning TEM (STEM) mode was conducted using a GATAN 806 HAADF STEM detector. .. EDS analysis in STEM mode was performed using an Oxford Instruments X-Max 65T SDD detector.

Article Title: Trivalent titanium in high-titanium lunar ilmenite.
Article Snippet: .. The TEM was operated in STEM mode to acquire 4D-STEM diffraction patterns using a dwell time of 500 ns, a convergence angle of 0.40 mRad, and a pixel size of 4 × 4 nm2 with a Gatan OneView camera. ..

Article Title: Trivalent titanium in high-titanium lunar ilmenite
Article Snippet: .. The TEM was operated in STEM mode to acquire 4D-STEM diffraction patterns using a dwell time of 500 ns, a convergence angle of 0.40 mRad, and a pixel size of 4 × 4 nm 2 with a Gatan OneView camera. ..

Spectroscopy:

Article Title: Visualizing the atomic structure of nitrogen-vacancy color center in diamond by multislice electron ptychography
Article Snippet: .. The electron probe used a convergence semi-angle of 24.3 mrad with a beam current of 10 pA. Each 4D-STEM dataset was captured using a Gatan K3 camera, which was installed after the spectroscopy. ..

Microscopy:

Article Title: Identifying Strain Stacking Boundaries between Multiphase Domains in Atomically Thin Two-Dimensional Magnets.
Article Snippet: Stacking engineering of van der Waals materials is an important strategy to control the materials’ properties, such as electronic correlations, ferroelectricity, and layer-dependent two-dimensional magnetism.. A timely testbed for the study of the latter is atomically thin chromium trihalides (CrX3, X = Cl, Br, I).. Notably, by understanding the sliding mechanism between different stacking sequences, control of the stacking arrangement, and thus magnetic properties in CrX3, can be achieved.

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