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scanning white-light interference microscope vertscan  (Ryoka Systems Inc)

 
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    Structured Review

    Ryoka Systems Inc scanning white-light interference microscope vertscan
    Scanning White Light Interference Microscope Vertscan, supplied by Ryoka Systems Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/three-dimensional+surface+structure+analyzing+microscope+using+scanning+white-light+interferometry/scanning+white+light+interference+microscope+vertscan/us11852785-133-2-9
    Average 90 stars, based on 1 article reviews
    scanning white-light interference microscope vertscan - by Bioz Stars, 2026-10
    90/100 stars

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    other:

    Article Title: Transparent substrate for liquid crystal device, and light control sheet
    Article Snippet: Evaluation Method Surface Roughness A white light interferometer (VertScan, manufactured by Ryoka Systems Inc.) was used to measure the arithmetic mean roughness Ra of the second surface included by the lubricious layer.

    Article Title: Transparent product and method for producing transparent product
    Article Snippet: TABLE 1 Experimental Experimental Experimental Experimental Experimental Experimental Example 1 Example 2 Example 3 Example 4 Example 5 Example 6 Nozzle Diameter (mm) 0.4 0.6 0.4 0.6 0.4 0.6 Atomization Air Pressure (MPa) 0.4 0.2 0.4 0.2 0.4 0.2 Liquid Flow Rate (kg/hour) 0.3 0.3 0.3 0.3 0.3 0.3 Amount of Coating(g/m2) 31.3 31.3 31.3 52.1 62.5 72.9 Surface Temperature (° C.) 20 20 71 70 71 70 Experimental Experimental Experimental Experimental Experimental Experimental Example 7 Example 8 Example 9 Example 10 Example 11 Example 12 Nozzle Diameter (mm) 0.4 0.6 0.4 0.4 0.8 0.4 Atomization Air Pressure (MPa) 0.4 0.2 0.4 0.4 0.2 0.4 Liquid Flow Rate (kg/hour) 0.3 0.3 0.4 0.4 0.3 0.2 Amount of Coating(g/m2) 52.1 41.7 19.1 38.3 47.5 20.8 Surface Temperature (° C.) 71 20 69 69 20 71 Analysis of Surface Shape of Antiglare Surface The shape z(x, y) of the antiglare surface on the transparent article of each experimental example was measured using a scanning white-light interference microscope (VertScan manufactured by Ryoka Systems Inc.).

    Article Title: Deposition mask, method of manufacturing deposition mask and metal plate
    Article Snippet: For example, when the surface roughness is measured using a scanning white light interferometer VertScan manufactured by Ryoka Systems Inc., each surface roughness in the high-adhesion region 55 and the low-adhesion region 56 is within the following ranges.

    Article Title: Transparent article having a roughened uneven surface
    Article Snippet: Specifically, a scanning white-light interference microscope (VertScan, manufactured by Ryoka Systems Inc.) was used to measure three-dimensional data of the uneven surface of the transparent articles.

    Article Title: Article with anti-glare surface
    Article Snippet: Specifically, roughness data of the antiglare surface of each sample was obtained with a scanning white-light interference microscope (manufactured by Ryoka Systems Inc., VertScan).

    Microscopy:

    Article Title: Electrophotographic belt and electrophotographic image forming apparatus
    Article Snippet: .. The surface of the electrophotographic belt was observed at a magnification of 50 times with a scanning white light interference microscope (trade name: Vert Scan, manufactured by Ryoka Systems Inc.) to confirm the width and depth of the groove. ..

    Clinical Proteomics:

    Article Title: Dispersion
    Article Snippet: .. L/S=5 μm/5 μm pattern formed: A (satisfactory fine printing property) L/S=5 μm/5 μm pattern contained removal defects or transfer defects: C (poor fine printing property) (5) Surface Roughness of Formed Pattern The surface roughness of the pattern obtained in (3) was measured using a “VertScan” white interferometer by Ryoka Systems, Inc. (6) Formation of conductive films (Comparative Examples 1-1 and 1-6, and Example 1-1) A microwave plasma furnace was used to introduce process gas (3 vol % hydrogen, 97 vol % helium) into a vacuum chamber at a flow rate of 300 sccm, while firing the print pattern obtained in (3) above for 5 minutes with an output of 1.5 kW, to obtain a conductive film with a thickness of 0.2 μm. .. The dimensional change factor of the obtained film was less than 0.05%, and no noticeable deformation such as wrinkles were seen. (7) Volume Resistivity of Conductive Film The volume resistivity of the conductive film obtained in (6) above was measured using a LORESTA GP low resistivity meter by Mitsubishi Chemical Corp.

    Introduce:

    Article Title: Dispersion
    Article Snippet: .. L/S=5 μm/5 μm pattern formed: A (satisfactory fine printing property) L/S=5 μm/5 μm pattern contained removal defects or transfer defects: C (poor fine printing property) (5) Surface Roughness of Formed Pattern The surface roughness of the pattern obtained in (3) was measured using a “VertScan” white interferometer by Ryoka Systems, Inc. (6) Formation of conductive films (Comparative Examples 1-1 and 1-6, and Example 1-1) A microwave plasma furnace was used to introduce process gas (3 vol % hydrogen, 97 vol % helium) into a vacuum chamber at a flow rate of 300 sccm, while firing the print pattern obtained in (3) above for 5 minutes with an output of 1.5 kW, to obtain a conductive film with a thickness of 0.2 μm. .. The dimensional change factor of the obtained film was less than 0.05%, and no noticeable deformation such as wrinkles were seen. (7) Volume Resistivity of Conductive Film The volume resistivity of the conductive film obtained in (6) above was measured using a LORESTA GP low resistivity meter by Mitsubishi Chemical Corp.



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