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singletilt in situ cooling holder  (Gatan Inc)


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    Gatan Inc singletilt in situ cooling holder
    Singletilt In Situ Cooling Holder, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 12074 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/stem+imaging+mode/DigitalMicrograph+Software/pm37505392-214-11-16
    Average 97 stars, based on 12074 article reviews
    singletilt in situ cooling holder - by Bioz Stars, 2026-11
    97/100 stars

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    Related Articles

    Microscopy:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Software:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Electrochemiluminescence:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Transmission Assay:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Transmission Electron Microscopy:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Electron Microscopy:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Centrifugation:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Staining:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Concentration Assay:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Imaging:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Cell Culture:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Produced:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur

    Control:

    Article Title: Alloy exsolution in co-doped PrBaMn2-xTMxO5+δ (TM = Co and/or Ni) obtained by mechanochemistry
    Article Snippet: were performed by combining HAADF and EDX acquisitions in STEM mode and were accomplished with the VELOX software (FEI Europe). HR micrograph analysis, fast Fourier transform (FFT) and phase interpretation were done with the Gatan Digital Micrograph software (Gatan Inc.) and the Java version of the electron microscope software (JEMS). The electrode polarization resistance in air and hydrogen atmospheres was determined in symmetrical cell configur



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    Image Search Results


    Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification ADF-STEM image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film and Al2O3 substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.

    Journal: Advanced materials (Deerfield Beach, Fla.)

    Article Title: Self-Oxidation Resistance of the Curved Surface of Achromatic Copper.

    doi: 10.1002/adma.202210564

    Figure Lengend Snippet: Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification ADF-STEM image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film and Al2O3 substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.

    Article Snippet: In combination with STEM imaging, elemental mapping of the Cu films grown on Al2O3 (0001) substrates was performed in the same STEM imaging mode using an EDX spectrometer (JED-2300T, JEOL) with a dual-type silicon drift detector and a large effective solid angle (≈1.2 sr).

    Techniques: Imaging