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quantile functions for the log-normal, exponential and weibull distributions  (MathWorks Inc)


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    MathWorks Inc quantile functions for the log-normal, exponential and weibull distributions
    Quantile Functions For The Log Normal, Exponential And Weibull Distributions, supplied by MathWorks Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/log-normal+distribution+function/10__1007_slash_s00180___015___0576___8-178-8-16
    Average 90 stars, based on 1 article reviews
    quantile functions for the log-normal, exponential and weibull distributions - by Bioz Stars, 2026-10
    90/100 stars

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    Article Title: Bayesian estimation and inference for log-ACD models
    Article Snippet: This paper adapts Bayesian Markov chain Monte Carlo methods for application to some auto-regressive conditional duration models.. Subsequently, the properties of these estimators are examined and assessed across a range of possible conditional error distributions and dynamic specifications, including under error mis-specification.. A novel model error distribution, employing a truncated skewed Student-t distribution is proposed and the Bayesian estimator assessed for it.



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    The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.

    Journal: Chempluschem

    Article Title: Effect of UV Light Exposure Duration on the Removal of Exfoliation Agent Residues in Two‐Dimensional Perovskite Nanosheets: An AFM Study

    doi: 10.1002/cplu.202400678

    Figure Lengend Snippet: The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.

    Article Snippet: The most probable adhesion force values were determined for each condition by applying a log‐normal probability distribution function to the histograms (SigmaPlot, Systat Software Inc.).

    Techniques: