electron backscatter diffraction (ebsd) detector tsl (TexSEM Laboratories)
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Electron Backscatter Diffraction (Ebsd) Detector Tsl, supplied by TexSEM Laboratories, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscattered+diffraction+analysis/electron+backscatter+diffraction/pmc07660219-70-19-25
Average 90 stars, based on 1 article reviews
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1) Product Images from "Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting"
Article Title: Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
Journal: Materials
doi: 10.3390/ma13214728
Figure Legend Snippet: Electron backscatter diffraction (EBSD) mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.
Techniques Used: Sample Prep
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