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electron backscatter diffraction ebsd analysis  (JEOL)


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    JEOL electron backscatter diffraction ebsd analysis
    <t>EBSD</t> analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.
    Electron Backscatter Diffraction Ebsd Analysis, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 13663 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscatter+diffraction+ebsd/JSM-7800F+Scanning+Electron+Microscope/pmc13165365-61-0-9
    Average 99 stars, based on 13663 article reviews
    electron backscatter diffraction ebsd analysis - by Bioz Stars, 2026-10
    99/100 stars

    Images

    1) Product Images from "Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches"

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    Journal: Materials

    doi: 10.3390/ma19091831

    EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.
    Figure Legend Snippet: EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Techniques Used:

    EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.
    Figure Legend Snippet: EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Techniques Used:

    Related Articles

    Scanning Electron Microscopy:

    Article Title: Relationship between the branching architecture and hydrolysis behavior of poly(lactic acid) with precisely controlled molecular structures
    Article Snippet: .. To investigate the surface structures of the porous and nonporous films, we applied field-emission scanning electron microscopy (FE-SEM; JSM-7800F, JEOL Ltd, Tokyo, Japan) at an acceleration voltage of 1 kV and a working distance of 10 mm. .. The surfaces of the films were investigated by drying them and coating them with a 3-nm thick layer of osmium using an osmium coater (OPC80T-G, Filgen, Inc., Aichi, Japan) prior to analysis.



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    Image Search Results


    EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques:

    EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques:

    EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Journal: Materials

    Article Title: Effect of Tempering Temperature on Microstructural Evolution and Mechanical Properties of Cr-Ni-Mo-V Steel for Pressure Vessel Applications

    doi: 10.3390/ma19091679

    Figure Lengend Snippet: EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Article Snippet: For orientation and grain boundary analysis, specimens were electropolished in a 5% perchloric acid–ethanol solution at 15 V for 50 s. The crystal orientation and grain boundary distribution of the experimental steel were analyzed by means of an electron backscatter diffraction (EBSD) detector (EDAX Velocity Super) (EDAX LLC, Mahwah, NJ, USA), and the data acquisition step was 0.2 μm.

    Techniques: