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JEOL electron backscatter diffraction ebsd detector e g
Electron Backscatter Diffraction Ebsd Detector E G, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 2437 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction+detector/JSM-IT800+Scanning+Electron+Microscope/pmc13092627-49-10-4
Average 98 stars, based on 2437 article reviews

electron backscatter diffraction ebsd detector e g - by Bioz Stars, 2026-11

98/100 stars

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Irradiation:

Article Title: Nanoscale Analysis of Large Deformation of Tough Microparticle-Based Polymer Films Revealed by Atomic Force Microscopy and Small-Angle X-ray Scattering.
Article Snippet: After standing for 5 min to allow the EtOH to evaporate sufficiently, the glass substrate (18 mm × 18 mm; Matsunami Glass Ind., Ltd.) was immersed and then lifted slowly. .. After drying the prepared substrate at room temperature, the sample was irradiated with Pt/Pd sputtering for 240 s. FE-SEM (JSM-IT800, JEOL Ltd.) observation was performed at 15 kV. ..

Microscopy:

Article Title: Reproducibility of Colloidal Lignin Particle Preparation: An Interlaboratory Evaluation
Article Snippet: .. JSM-IT 800 (JEOL Ltd, Japan) (secondary electron detector), JSM-7000F (JEOL Ltd, Japan) (Sweden); Field emission (FE) SEM Σigma|VP (Zeiss, Germany) equipped with a thermal field emission gun (Schottky emitter) source (Italy); Scios 2 DualBeam Sy Focused Ion Beam Scanning Electron microscope (USA) (Spain); FEI_Apreo (Thermo Fisher Scientific, USA) (China); Hitachi S-4800 microscope (Hitachi, Japan) (Finland); Zeiss Crossbeam350 FIB-SEM (Canada); and Tescan Mira3 (Tescan, Czech Republic) (Finland). .. Image analysis was performed for at least 300 particles per sample (unless stated otherwise) using the ImageJ software.29 Fiji, a variant of ImageJ, was used in Canada.30 For the analysis of the size and morphology, the following parameters were reported (average of 300 particles).

Article Title: Comparative proteomics reveals hydrogenase-centered steel-dependent growth and corrosion in Desulfovibrio vulgaris and Desulfovibrio ferrophilus .
Article Snippet: .. SEM images were recorded with a field emission scanning electron microscope JSM-IT800 (HL, JEOL Ltd., Tokyo, Japan) at accelerating voltages of 2 kV using standard SE detector. .. Energy-dispersive X-ray spectroscopy and chemical element mapping were performed with a silicon drift detector (SDD) EX-74710U1L4Q (DrySDTM60 Detector, JEOL Ltd.) at accelerating voltages of 15 kV.

FIB-SEM:

other:

Article Title: Carbon enriched zinc aluminum iron oxide and zinc oxide as novel ceramic nanocomposite for facilitated basic yellow 28 sequestration
Article Snippet: Surface morphology and elemental composition were examined by field-emission scanning electron microscopy coupled with energy-dispersive X-ray spectroscopy (FESEM/EDX, JSM-IT800 Schottky, JEOL Ltd., Japan).

Article Title: Upcycling Polypropylene Waste into Carbon Anode Materials for Lithium-Ion Batteries.
Article Snippet: Energy-dispersive X-ray spectroscopy (EDS, JEOL JSM-IT800, JEOL Ltd., Tokyo, Japan) elemental mapping of carbon, oxygen and sulfur was carried out on the same microscope, and the composition was quantified from the map sum spectrum of each mapped area.

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