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backscattered electron detector (bse  (Carl Zeiss)


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    Structured Review

    Carl Zeiss backscattered electron detector (bse
    Microstructure of the as-received material observed by means of scanning electron microscopy (SEM) in <t>backscattered</t> <t>electron</t> <t>mode</t> <t>(BSE)</t> showing Al-FeMnSi (large and small) in white, and Mg 2 Si in black. ( a ) Overview and ( b ) detail of rectangle shown in ( a ).
    Backscattered Electron Detector (Bse, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/ebsd+electron+backscatter+diffraction+maps/backscattered+detector+electron/pmc06117804-46-22-13
    Average 90 stars, based on 1 article reviews
    backscattered electron detector (bse - by Bioz Stars, 2026-10
    90/100 stars

    Images

    1) Product Images from "Microstructure Evolution in a 6082 Aluminium Alloy during Thermomechanical Treatment"

    Article Title: Microstructure Evolution in a 6082 Aluminium Alloy during Thermomechanical Treatment

    Journal: Materials

    doi: 10.3390/ma11081319

    Microstructure of the as-received material observed by means of scanning electron microscopy (SEM) in backscattered electron mode (BSE) showing Al-FeMnSi (large and small) in white, and Mg 2 Si in black. ( a ) Overview and ( b ) detail of rectangle shown in ( a ).
    Figure Legend Snippet: Microstructure of the as-received material observed by means of scanning electron microscopy (SEM) in backscattered electron mode (BSE) showing Al-FeMnSi (large and small) in white, and Mg 2 Si in black. ( a ) Overview and ( b ) detail of rectangle shown in ( a ).

    Techniques Used: Electron Microscopy

    Microstructure of AA6082 after cold deformation determined by electron backscattered diffraction (EBSD) showing the cells in the ( a ) image quality (IQ) as well as ( b ) in the Kernel map. Black non-indexed areas represent the intermetallic positions.
    Figure Legend Snippet: Microstructure of AA6082 after cold deformation determined by electron backscattered diffraction (EBSD) showing the cells in the ( a ) image quality (IQ) as well as ( b ) in the Kernel map. Black non-indexed areas represent the intermetallic positions.

    Techniques Used:

    Related Articles

    other:

    Article Title: Changes in electrical and mechanical properties of additively manufactured CuCrZr alloy due to thermal exposure and plastic deformation
    Article Snippet: Therefore, a Zeiss ULTRA GEMINI high-resolution field emission gun scanning electron microscope (SEM) equipped with an electron back-scatter diffraction (EBSD) unit was used.

    Article Title: Oral dysbiosis initiates periodontal disease in experimental kidney disease
    Article Snippet: All SEM imaging was done using 20 kV accelerating voltage and a solid state backscattered electron (BSE) detector, using a chamber pressure of 50 Pa in a Zeiss EVO MA10 scanning electron microscope.

    Article Title: Multi-scaled heterostructure enables superior strength–ductility combination of a CoCrFeMnN compositionally-complex alloy
    Article Snippet: Compositionally-complex alloys (CCAs) with the face-centered cubic (fcc) structure exhibit excellent fracture toughness and stable mechanical property across a broad temperature range from cryogenic to room temperatures.. However, yield strength of those alloys is usually low, making them difficult to meet the demands of practical engineering application.. In a prototype CCA with the nominal chemical composition of Co10 Cr10 Fe49 Mn30 N1 (atom percent), a multi-scaled heterostructure from sample to atomic scales was obtained by performing triaxial cyclic compression and short-term annealing on the blocky alloy.

    Article Title: A nonenzymatic dependency on inositol-requiring enzyme 1 controls cancer cell cycle progression and tumor growth.
    Article Snippet: Sections were imaged with a Zeiss Gemini 300 scanning electron microscope and a BSD1 backscattered electron detector.

    Imaging:

    Article Title: Nanoscale dendritic shaft constrictions shape synaptic integration in fine caliber principal neuron dendrites
    Article Snippet: .. Imaging of the samples was done in a Zeiss Crossbeam 550 with backscattered electron detector or STEM detector, respectively. ..

    Electron Microscopy:

    Article Title: Impact of Tylosin Tartrate and Ciprofloxacin on the Deposition of Negatively Charged Polystyrene Nanoparticles onto SiO 2 .
    Article Snippet: .. To confirm the sizes reported by the manufacturer, dilute solutions of NPs in isopropyl alcohol were drop-casted onto scanning electron microscopy (SEM) stubs, sputter-coated with gold, and imaged by using a Zeiss EVO SEM instrument with a SE1 detector ..

    Article Title: Impact of Tylosin Tartrate and Ciprofloxacin on the Deposition of Negatively Charged Polystyrene Nanoparticles onto SiO 2 .
    Article Snippet: .. To confirm the sizes reported by the manufacturer, dilute solutions of NPs in isopropyl alcohol were drop-casted onto scanning electron microscopy (SEM) stubs, sputter-coated with gold, and imaged by using a Zeiss EVO SEM instrument with a SE1 detector (Figure S1). ..



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    Image Search Results


    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: Recrystallization

    Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques:

    Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: