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AMETEK inc digital micrograph 3.2 software
Digital Micrograph 3.2 Software, supplied by AMETEK inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/digital+micrograph+software+package/digital+micrograph+3+2+software/pmc10934120-49-67-71
Average 90 stars, based on 1 article reviews
digital micrograph 3.2 software - by Bioz Stars, 2026-11
90/100 stars

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Related Articles

Microscopy:

Article Title: Effect of In Situ NbC-Cr 7 C 3 @graphene/Fe Nanocomposite Inoculant Modification and Refinement on the Microstructure and Properties of W18Cr4V High-Speed Steel
Article Snippet: The influence of nanocrystalline ceramic particles present in the inoculant on the carbides in the steel and the refinement mechanism were evaluated using metallographic microscopy (Axio Imager M2m, Carl Zeiss., Oberkochen, Germany), scanning electron microscopy (SEM; Hitachi S-4800, Hitachi., Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM; Jeol 2011, JEOL., Ltd., Tokyo, Japan), energy spectrum analysis, X-ray diffraction (XRD; Bruker D8 FOCUS, Brooke Co., Ltd., Saarbrucken, Germany), and Digital Micrograph 3.2 software (AMETEK, Inc., Berwyn, IL, USA).

Electron Microscopy:

Article Title: Effect of In Situ NbC-Cr 7 C 3 @graphene/Fe Nanocomposite Inoculant Modification and Refinement on the Microstructure and Properties of W18Cr4V High-Speed Steel
Article Snippet: The influence of nanocrystalline ceramic particles present in the inoculant on the carbides in the steel and the refinement mechanism were evaluated using metallographic microscopy (Axio Imager M2m, Carl Zeiss., Oberkochen, Germany), scanning electron microscopy (SEM; Hitachi S-4800, Hitachi., Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM; Jeol 2011, JEOL., Ltd., Tokyo, Japan), energy spectrum analysis, X-ray diffraction (XRD; Bruker D8 FOCUS, Brooke Co., Ltd., Saarbrucken, Germany), and Digital Micrograph 3.2 software (AMETEK, Inc., Berwyn, IL, USA).

Transmission Assay:

Article Title: Effect of In Situ NbC-Cr 7 C 3 @graphene/Fe Nanocomposite Inoculant Modification and Refinement on the Microstructure and Properties of W18Cr4V High-Speed Steel
Article Snippet: The influence of nanocrystalline ceramic particles present in the inoculant on the carbides in the steel and the refinement mechanism were evaluated using metallographic microscopy (Axio Imager M2m, Carl Zeiss., Oberkochen, Germany), scanning electron microscopy (SEM; Hitachi S-4800, Hitachi., Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM; Jeol 2011, JEOL., Ltd., Tokyo, Japan), energy spectrum analysis, X-ray diffraction (XRD; Bruker D8 FOCUS, Brooke Co., Ltd., Saarbrucken, Germany), and Digital Micrograph 3.2 software (AMETEK, Inc., Berwyn, IL, USA).

X-ray Diffraction:

Article Title: Effect of In Situ NbC-Cr 7 C 3 @graphene/Fe Nanocomposite Inoculant Modification and Refinement on the Microstructure and Properties of W18Cr4V High-Speed Steel
Article Snippet: The influence of nanocrystalline ceramic particles present in the inoculant on the carbides in the steel and the refinement mechanism were evaluated using metallographic microscopy (Axio Imager M2m, Carl Zeiss., Oberkochen, Germany), scanning electron microscopy (SEM; Hitachi S-4800, Hitachi., Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM; Jeol 2011, JEOL., Ltd., Tokyo, Japan), energy spectrum analysis, X-ray diffraction (XRD; Bruker D8 FOCUS, Brooke Co., Ltd., Saarbrucken, Germany), and Digital Micrograph 3.2 software (AMETEK, Inc., Berwyn, IL, USA).

Software:

Article Title: Effect of In Situ NbC-Cr 7 C 3 @graphene/Fe Nanocomposite Inoculant Modification and Refinement on the Microstructure and Properties of W18Cr4V High-Speed Steel
Article Snippet: The influence of nanocrystalline ceramic particles present in the inoculant on the carbides in the steel and the refinement mechanism were evaluated using metallographic microscopy (Axio Imager M2m, Carl Zeiss., Oberkochen, Germany), scanning electron microscopy (SEM; Hitachi S-4800, Hitachi., Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM; Jeol 2011, JEOL., Ltd., Tokyo, Japan), energy spectrum analysis, X-ray diffraction (XRD; Bruker D8 FOCUS, Brooke Co., Ltd., Saarbrucken, Germany), and Digital Micrograph 3.2 software (AMETEK, Inc., Berwyn, IL, USA).



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