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x pert pro diffractometer  (Philips Healthcare)

 
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    Philips Healthcare x pert pro diffractometer
    X Pert Pro Diffractometer, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffractometer/pm41747576-211-8-11?v=Philips+Healthcare
    Average 86 stars, based on 1 article reviews
    x pert pro diffractometer - by Bioz Stars, 2026-07
    86/100 stars

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    Image Search Results


    Structural characterization of HC. (A) Schematic illustration of the synthesis of HC. (B, C) TEM images of Cu 5.4 O and HC. (D) Energy-dispersive X-ray spectroscopy (EDS) mapping images of C, N, Cu and O for HC. (E) Zeta potentials and hydrodynamic size distribution, and (F) XRD analysis of Cu 5.4 O, HAs and HC. (G, H) XPS spectra of Cu 2p of Cu 5.4 O and HC. (I) X-ray-induced Auger electron spectroscopy (XAES) spectra of the Cu 5.4 O. (J) Size stability of HC in different solvents (Water, PBS, FBS, DMEM) on days 3, 5, and 7 at a concentration of 200 μg/mL, with a sample size of n = 3 (mean ± SD). (∗P < 0.05, ∗∗P < 0.01, ∗∗∗P < 0.001).

    Journal: Bioactive Materials

    Article Title: Smart microenvironment-adaptive nanocatalytic hydrogel for sequential antibacterial, anti-inflammatory, and regenerative therapy of biofilm-infected wounds

    doi: 10.1016/j.bioactmat.2026.02.043

    Figure Lengend Snippet: Structural characterization of HC. (A) Schematic illustration of the synthesis of HC. (B, C) TEM images of Cu 5.4 O and HC. (D) Energy-dispersive X-ray spectroscopy (EDS) mapping images of C, N, Cu and O for HC. (E) Zeta potentials and hydrodynamic size distribution, and (F) XRD analysis of Cu 5.4 O, HAs and HC. (G, H) XPS spectra of Cu 2p of Cu 5.4 O and HC. (I) X-ray-induced Auger electron spectroscopy (XAES) spectra of the Cu 5.4 O. (J) Size stability of HC in different solvents (Water, PBS, FBS, DMEM) on days 3, 5, and 7 at a concentration of 200 μg/mL, with a sample size of n = 3 (mean ± SD). (∗P < 0.05, ∗∗P < 0.01, ∗∗∗P < 0.001).

    Article Snippet: X-ray diffraction (XRD) patterns were conducted on a Bruker D8 ADVANCE X-ray diffractometer using Cu-Kα radiation (λ = 1.5418 Å).

    Techniques: Spectroscopy, Concentration Assay