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electron backscatter diffraction (ebsd, ulvac phi-710, kanagawa, japan) mapping  (ULVAC)

 
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    ULVAC electron backscatter diffraction (ebsd, ulvac phi-710, kanagawa, japan) mapping
    Electron Backscatter Diffraction (Ebsd, Ulvac Phi 710, Kanagawa, Japan) Mapping, supplied by ULVAC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction+ebsd+maps/phi+710+microprobe/pmc08620976-32-10-6
    Average 90 stars, based on 1 article reviews
    electron backscatter diffraction (ebsd, ulvac phi-710, kanagawa, japan) mapping - by Bioz Stars, 2026-10
    90/100 stars

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    Article Title: Characteristic Resistive Switching of Rare-Earth Oxyhydrides by Hydride Ion Insertion and Extraction.
    Article Snippet: Resistive switching induced by ion migration is promising for applications such as random-access memory (ReRAM) and neuromorphic transistors.. Hydride ions (H−) are an interesting candidate as the migration ion for resistive switching devices because they have fast diffusion in several compounds at room temperature and doping/dedoping can be used effectively to achieve significant changes in the electronic conductivity.. Here, we report reversible resistive switching characteristics in rare-earth oxyhydrides (REHxO(3−x)/2) induced by field insertion/extraction of H −.

    Article Title: The golden alloy Cu-5Zn-5Al-1Sn: A multi-analytical surface characterization
    Article Snippet: The elemental information of the outmost surface region of Cu5Zn5Al1Sn after 4 weeks exposure in dry air was obtained with an AES-setup (PHI 710 Scanning Auger Microscopy, ULVAC-PHI, Japan) at an electron incidence angle of 30° and with an Ar+ ion gun voltage of 10 kV.

    Article Title: Interlayer Decoupling in 30° Twisted Bilayer Graphene Quasicrystal.
    Article Snippet: Electron backscattering diffraction (EBSD) measurements were carried out on a ULVAC-PHI (PHI 710) Auger system equipped with the EBSD probe (EDAX, https://dx.doi.org/10.1021/acsnano.9b07091 ACS Nano XXXX, XXX, XXX−XXX F DigView).

    Article Title: Fatigue crack initiation behaviors around defects induced by welding thermal cycle in superalloy IN617B
    Article Snippet: In this study, fatigue crack initiation behaviors around defects induced by welding thermal cycle in IN617B were investigated by in-situ fatigue tests combined with DIC (Digital Image Correlation) and EBSD (Electron Back Scattering Diffraction) characterization.. Two mechanisms of fatigue crack initiation around defects were clarified and the distance of crack initiation position from defects was proposed to determine which mechanism was dominant.. Intergranular fatigue crack initiation caused by pile-up of dislocations was dominant in the far-field region from defects, while intragranular fatigue crack initiation caused by cracking at the interface between dislocation bands and matrix was dominant in the near-field region from defects.

    Article Title: Bottom-Up-Etching-Mediated Synthesis of Large-Scale Pure Monolayer Graphene on Cyclic-Polishing-Annealed Cu(111).
    Article Snippet: EBSD data were obtained with ULVAC-PHI 710 under the voltage of 15 kV and the current of 10 nA, and the probe model was EDAX OIM 6.0.

    Article Title: Controlled Epitaxial Growth and Atomically Sharp Interface of Graphene/Ferromagnetic Heterostructure via Ambient Pressure Chemical Vapor Deposition
    Article Snippet: Additionally, the electron backscatter diffraction (EBSD, ULVAC PHI-710, Kanagawa, Japan) mapping (see b) in the uniform blue reveals the out-of-plane (111) orientation without the twin structures combined with the four evenly distributed points in the pole figure (inside of b).

    Spectroscopy:

    Article Title: Design of continuous built-in band bending in self-supported CdS nanorod-based hierarchical architecture for efficient photoelectrochemical hydrogen production
    Article Snippet: The ever-increasing desire for clean and renewable energy has triggered the development of novel materials for photoelectrochemical (PEC) water splitting.. However, elaborate design of photoanode materials with high light-harvesting capability, high charge-separation efficiency and long-term stability for converting solar energy into hydrogen fuel is highly challenged.. Herein, we fabricated the self-supported gradient oxygen-doped three-dimensional (3D) CdS branched nanorod array (Grad-O CdS), in which a continuous built-in band bending structure was constructed by gradually oxygen doping.

    Article Title: Research on the Microstructures and Mechanical Properties of Bainite/Martensite Rail Treated by the Controlled-Cooling Process
    Article Snippet: The specimens for transmission electron microscope (TEM; JEOL F200, 200 kV, JEOL, Tokyo, Japan) were electropolished at −30 °C using 6% perchloric acid solution. .. Auger electron spectroscopy (AES, ULVAC-PHI, Inc., Chigasaki, Japan) was applied for electron backscatter diffraction (EBSD) measurements utilizing a PHI 710 microprobe operating (ULVAC-PHI, Inc., Chigasaki, Japan) at 20 kV with a step size of 0.1 μm. ..



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    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of <t>EBSD</t> and nanoindentation mapping in the current study is indicated in (b).
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    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of <t>EBSD</t> and nanoindentation mapping in the current study is indicated in (b).
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    ULVAC electron backscatter diffraction (ebsd, ulvac phi-710, kanagawa, japan) mapping
    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of <t>EBSD</t> and nanoindentation mapping in the current study is indicated in (b).
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    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: Recrystallization

    Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques:

    Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: