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The scattering parameter | S 21 | of the microwave intelligent sensing (MIS) obtained using <t>HFSS,</t> where the resonators A and C are loaded by dielectric materials with the relative permittivity of 4.806 and 2.015, respectively, while resonator B is loaded by the dielectric material with permittivity of 3.215.
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The scattering parameter | S 21 | of the microwave intelligent sensing (MIS) obtained using HFSS, where the resonators A and C are loaded by dielectric materials with the relative permittivity of 4.806 and 2.015, respectively, while resonator B is loaded by the dielectric material with permittivity of 3.215.

Journal: Sensors (Basel, Switzerland)

Article Title: Intelligent Sensing Using Multiple Sensors for Material Characterization

doi: 10.3390/s19214766

Figure Lengend Snippet: The scattering parameter | S 21 | of the microwave intelligent sensing (MIS) obtained using HFSS, where the resonators A and C are loaded by dielectric materials with the relative permittivity of 4.806 and 2.015, respectively, while resonator B is loaded by the dielectric material with permittivity of 3.215.

Article Snippet: With the dielectric variation of M m , the response of the system modulated with the reference materials ( M u ) and ( M l ) and the MUT ( M m ) are extracted using the commercial three-dimensional full-wave simulation ANSYS HFSS [ ] as shown in .

Techniques: