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Image Search Results


EBSD analysis for 0.07 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.

Journal: Materials

Article Title: Microstructure and Mechanical Performance of PBF-LB/M 316L Stainless Steel

doi: 10.3390/ma18122720

Figure Lengend Snippet: EBSD analysis for 0.07 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.

Article Snippet: SEM (Sigma 30, Carl Zeiss, Oberkochen, Germany) was used to analyze surface and cross-sectional microstructures, while the QUANTAX EBSD device (Bruker, Ltd., Billerica, MA, USA) provided grain orientation and texture information.

Techniques:

EBSD analysis for 0.11 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.

Journal: Materials

Article Title: Microstructure and Mechanical Performance of PBF-LB/M 316L Stainless Steel

doi: 10.3390/ma18122720

Figure Lengend Snippet: EBSD analysis for 0.11 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.

Article Snippet: SEM (Sigma 30, Carl Zeiss, Oberkochen, Germany) was used to analyze surface and cross-sectional microstructures, while the QUANTAX EBSD device (Bruker, Ltd., Billerica, MA, USA) provided grain orientation and texture information.

Techniques:

EBSD analysis for 0.15 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.

Journal: Materials

Article Title: Microstructure and Mechanical Performance of PBF-LB/M 316L Stainless Steel

doi: 10.3390/ma18122720

Figure Lengend Snippet: EBSD analysis for 0.15 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.

Article Snippet: SEM (Sigma 30, Carl Zeiss, Oberkochen, Germany) was used to analyze surface and cross-sectional microstructures, while the QUANTAX EBSD device (Bruker, Ltd., Billerica, MA, USA) provided grain orientation and texture information.

Techniques: