Journal: Nanomaterials

Article Title: Superior Strength and Ductility of 304 Austenitic Stainless Steel with Gradient Dislocations

doi: 10.3390/nano11102613

Figure Lengend Snippet: Cross-sectional EBSD images of the gradient dislocation structure (GDS) 304 SS processed by cyclic-torsion processing, showing the distributions of a grain-scaled morphology, orientation ( A ) and LABs ( B ) within an approximately 0.8 mm depth from the surface. The corresponding bright-field TEM images of the deformation structures at the topmost surface ( C ) and ~0.5 mm depth ( D ) of treated samples (indicated in a). The inset in C is the corresponding selected area electron diffraction patterns (SAEDs). ( E ) The corresponding statistic sizes of these dislocation patterns structure at different depths of the GDS 304 SS sample.

Article Snippet: The electron backscatter diffraction (EBSD) analysis of GDS samples was carried out on Zeiss (Jena, Germany) Supra 55 SEM under a voltage of 20 kV and a current of 6.0 nA with a step size of 500 nm.

Techniques:

Journal: Nanomaterials

Article Title: Superior Strength and Ductility of 304 Austenitic Stainless Steel with Gradient Dislocations

doi: 10.3390/nano11102613

Figure Lengend Snippet: Cross-sectional EBSD images of deformation features in the GDS 304 SS samples at a tensile strain of 40%, showing the distributions of grain-scaled morphology ( A ), LABs ( A ) and phase ( E ) within an approximately 0.2 mm depth from the surface, compared with that in the core ( B , D , F ).

Article Snippet: The electron backscatter diffraction (EBSD) analysis of GDS samples was carried out on Zeiss (Jena, Germany) Supra 55 SEM under a voltage of 20 kV and a current of 6.0 nA with a step size of 500 nm.

Techniques:

Journal: Materials

Article Title: Microstructure Refinement of a Transformation-Induced Plasticity High-Entropy Alloy

doi: 10.3390/ma14051196

Figure Lengend Snippet: Electron backscatter diffraction (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .

Article Snippet: The microstructures of the compressed samples were characterized using a scanning electron microscope (SEM, Hitachi S-3400N, HITACHI, Tokyo, Japan) equipped with an electron backscatter diffraction (EBSD, OIM Analysis, AMETEK Inc., Berwyn, PA, USA) detector.

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