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Examples of the elemental composition of the different contaminants and the background composition (zirconia) with <t>Phenom</t> <t>ProX–SEM–EDS;</t> measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2
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Examples of the elemental composition of the different contaminants and the background composition (zirconia) with <t>Phenom</t> <t>ProX–SEM–EDS;</t> measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2
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Examples of the elemental composition of the different contaminants and the background composition (zirconia) with <t>Phenom</t> <t>ProX–SEM–EDS;</t> measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2
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Examples of the elemental composition of the different contaminants and the background composition (zirconia) with <t>Phenom</t> <t>ProX–SEM–EDS;</t> measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2
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Examples of the elemental composition of the different contaminants and the background composition (zirconia) with <t>Phenom</t> <t>ProX–SEM–EDS;</t> measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2
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Examples of the elemental composition of the different contaminants and the background composition (zirconia) with <t>Phenom</t> <t>ProX–SEM–EDS;</t> measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2
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Image Search Results


Examples of the elemental composition of the different contaminants and the background composition (zirconia) with Phenom ProX–SEM–EDS; measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2

Journal: International Journal of Implant Dentistry

Article Title: Influence of exposure of customized dental implant abutments to different cleaning procedures: an in vitro study using AI-assisted SEM/EDS analysis

doi: 10.1186/s40729-023-00498-8

Figure Lengend Snippet: Examples of the elemental composition of the different contaminants and the background composition (zirconia) with Phenom ProX–SEM–EDS; measuring points are marked with a cross and number, percentages in atomic per cent: A–F sample from group NC, B shows the EDS spectrum for spot analysis spot 1, D shows the EDS spectrum for spot analysis spot 2, E , F subtracted spectra of the sample from group NC: spectrum 1–spectrum 2; G–L sample from group LA, H shows the EDS spectrum for spot analysis spot 1, J shows the EDS spectrum for spot analysis spot 2, K, L subtracted spectra for the sample from group LA: spectrum 1–spectrum 2

Article Snippet: All specimens were subjected to SEM and EDS analysis (Phenom-World B.V., Eindhoven, The Netherlands).

Techniques: