electron backscatter diffraction Search Results


electron backscatter diffraction ebsd  (Gatan Inc)
96
Gatan Inc electron backscatter diffraction ebsd
Electron Backscatter Diffraction Ebsd, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__1016_slash_j__jallcom__2018__11__109-38-9-24?v=Gatan+Inc
Average 96 stars, based on 1 article reviews
electron backscatter diffraction ebsd - by Bioz Stars, 2026-08
96/100 stars
  Buy from Supplier
k2 summit direct electron detector  (Gatan Inc)
96
Gatan Inc k2 summit direct electron detector
K2 Summit Direct Electron Detector, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/pm37198165-156-10-15?v=Gatan+Inc
Average 96 stars, based on 1 article reviews
k2 summit direct electron detector - by Bioz Stars, 2026-08
96/100 stars
  Buy from Supplier
3d ebsd data acquisition  (Gatan Inc)
96
Gatan Inc 3d ebsd data acquisition
3d Ebsd Data Acquisition, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/pm27863288-3-29-17?v=Gatan+Inc
Average 96 stars, based on 1 article reviews
3d ebsd data acquisition - by Bioz Stars, 2026-08
96/100 stars
  Buy from Supplier
chroma cl  (Gatan Inc)
95
Gatan Inc chroma cl
Chroma Cl, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 95/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__1029_slash_eost2010eo25-388-25-24?v=Gatan+Inc
Average 95 stars, based on 1 article reviews
chroma cl - by Bioz Stars, 2026-08
95/100 stars
  Buy from Supplier
electron backscatter diffraction map  (Meso Scale Diagnostics LLC)
90
Meso Scale Diagnostics LLC electron backscatter diffraction map
Electron Backscatter Diffraction Map, supplied by Meso Scale Diagnostics LLC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/pmc11805988__41467_2025_56709_MOESM4_ESM-191-65-61?v=Meso+Scale+Diagnostics+LLC
Average 90 stars, based on 1 article reviews
electron backscatter diffraction map - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscatter diffraction (ebsd)  (Hikari Sales USA)
90
Hikari Sales USA electron backscatter diffraction (ebsd)
Electron Backscatter Diffraction (Ebsd), supplied by Hikari Sales USA, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__1016_slash_j__actamat__2023__118720-60-6-10?v=Hikari+Sales+USA
Average 90 stars, based on 1 article reviews
electron backscatter diffraction (ebsd) - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscatter diffraction  (Verlag GmbH)
90
Verlag GmbH electron backscatter diffraction
Electron Backscatter Diffraction, supplied by Verlag GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__1002_slash_srin__201800425-27-8-19?v=Verlag+GmbH
Average 90 stars, based on 1 article reviews
electron backscatter diffraction - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscatter diffraction (ebsd) detector tsl  (TexSEM Laboratories)
90
TexSEM Laboratories electron backscatter diffraction (ebsd) detector tsl
Electron <t>backscatter</t> <t>diffraction</t> <t>(EBSD)</t> mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.
Electron Backscatter Diffraction (Ebsd) Detector Tsl, supplied by TexSEM Laboratories, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/pmc07660219-70-19-25?v=TexSEM+Laboratories
Average 90 stars, based on 1 article reviews
electron backscatter diffraction (ebsd) detector tsl - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscatter diffraction  (ANSYS inc)
90
ANSYS inc electron backscatter diffraction
Electron <t>backscatter</t> <t>diffraction</t> <t>(EBSD)</t> mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.
Electron Backscatter Diffraction, supplied by ANSYS inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__1016_slash_j__jmrt__2024__10__171-11-163-134?v=ANSYS+inc
Average 90 stars, based on 1 article reviews
electron backscatter diffraction - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscatter diffraction hikari super  (Hikari Sales USA)
90
Hikari Sales USA electron backscatter diffraction hikari super
Electron <t>backscatter</t> <t>diffraction</t> <t>(EBSD)</t> mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.
Electron Backscatter Diffraction Hikari Super, supplied by Hikari Sales USA, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/pm37834563-81-11-15?v=Hikari+Sales+USA
Average 90 stars, based on 1 article reviews
electron backscatter diffraction hikari super - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscattering diffraction ebsd oim analysis  (AMETEK inc)
90
AMETEK inc electron backscattering diffraction ebsd oim analysis
Electron <t>backscatter</t> <t>diffraction</t> <t>(EBSD)</t> mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.
Electron Backscattering Diffraction Ebsd Oim Analysis, supplied by AMETEK inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__3390_slash_met10010071-73-29-35?v=AMETEK+inc
Average 90 stars, based on 1 article reviews
electron backscattering diffraction ebsd oim analysis - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
electron backscatter diffraction system oim system  (TexSEM Laboratories)
90
TexSEM Laboratories electron backscatter diffraction system oim system
Electron <t>backscatter</t> <t>diffraction</t> <t>(EBSD)</t> mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.
Electron Backscatter Diffraction System Oim System, supplied by TexSEM Laboratories, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/electron+backscatter+diffraction/10__3390_slash_met7090375-59-24-31?v=TexSEM+Laboratories
Average 90 stars, based on 1 article reviews
electron backscatter diffraction system oim system - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

Image Search Results


Electron backscatter diffraction (EBSD) mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.

Journal: Materials

Article Title: Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting

doi: 10.3390/ma13214728

Figure Lengend Snippet: Electron backscatter diffraction (EBSD) mapping of pillars built with pulse energy of 161 mJ, laser pulse duration of 1 ms, stage speed 0.0167 mm/s, frequency of 200 Hz and powder feed rate of 1.0 g/min on a Si <111> wafer shown in dark blue color ( a ) and on a <100> substrate shown in red color ( b ) A higher powder feed rate (15 g/min) with otherwise identical conditions resulted in polycrystalline growth ( c ). The inverse pole figure (IPF) color scale shows the crystal orientations in the pillar growth direction . The corresponding SEM pictures ( d – f ), including the marked grain boundaries, reveal some deposition defects, post-deposition sample preparation cracks and polishing scratches.

Article Snippet: Characterization of the crystalline orientation of the grown material with respect to the wafer was then implemented by an electron backscatter diffraction (EBSD) detector (TSL, TexSEM Laboratories, Inc., Provo, UT, USA) mounted in a scanning electron microscope (SEM) chamber (DSM 962, Zeiss, Munich, Germany).

Techniques: Sample Prep